Journal publications

S. Matakias, Y. Tsiatouhas, A. Arapoyanni and Th. Haniotakis, «A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs», Special Issue of Journal of Electronic Testing: Theory and Applications 20, 2004, pp. 523-531. [ link ]
S. Matakias, Y. Tsiatouhas, Th. Haniotakis, A. Arapoyanni,«A Current Mode, Parallel, Two-Rail Code Checker», IEEE Transactions on Computers, Vol.57, No.8, August 2008, pp. 1032-1045. [ link ]
S. Matakias, Y. Tsiatouhas, A. Arapoyanni, Th. Haniotakis, «A current monitoring technique for IDDQ testing in digital integrated circuits», INTEGRATION, the VLSI journal, Vol. 50, 2015, pp. 48–60. [ link ]

Conference publications

G.Papastergiou, S.Matakias, I.Koukouvinos, G.Stratakos, N.Uzunoglou, «The development of a cost effective Fiber Optic Delay Line», SPIE vol. 3423, 1998, pp 107-111. [ link ]
Κ. Halkiotis, D. Υοvα, Ν. Uzunoglu, G. Papastergiou, S. Matakias, Ι. Koukouvinos, «Development of a red diode laser system for Photodynamic Therapy», SPIE, vol 3423, 1997, pp. 421-426 [link ]
S. Matakias, G. Papastergiou, «Design and Implementation of an Optoelectronic Transceiver for Optical Fiber Communication of Multiplexed Analog Voice, Digital Data and Video Signal»,
Y. Tsiatouhas, S. Matakias, A. Arapoyanni and Th. Haniotakis, «A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs», 9th IEEE International On-Line Testing Symposium (IOLTS), 7-9 July 2003, pp 12-16. [ link ]
S. Matakias, Y. Tsiatouhas, Th. Haniotakis and A. Arapoyanni, «Ultra Fast and Low Cost Parallel Two-Rail Code Checker Targeting High Fan-In Applications», VLSI, 2004. Proceedings. IEEE Computer society Annual Symposium on (ISVLSI), 19-20 February. 2004, pp 293-296. [ link ]
S. Matakias, Y. Tsiatouhas, Th. Haniotakis A. Arapoyanni, and A.Efthymiou, «Fast, Parallel Two-Rail Code Checker with Enhanced Testability», 11th IEEE International On-Line Testing Symposium (IOLTS) 2005, pp 149-156. [ link ]
S. Matakias, Y. Tsiatouhas, A. Arapoyanni, Th. Haniotakis, G. Prenat and S. Mir, «A Built-In IDDQ Testing Circuit», 31st European Solid-State Circuits Conference (ESSCIRC), 12-16 September 2005 , pp 471-474. [ link ]
S. Matakias, Y. Tsiatouhas, A. Arapoyanni, Th. Haniotakis, «An Embedded IDDQ Testing Circuit and Technique», 12th IEEE International Conference on Electronics, Circuits and Systems, 11-14 December 2005. [ link ]
S. Matakias, Y. Tsiatouhas, A. Arapoyanni, Th. Haniotakis,«A High Speed Circuit for Concurrent Detection of Soft Errors in CMOS ICs», Radiation Effects on Circuits and Systems (RADECS) 2006, pp A8 1-4. [ link ]