National and Kapodistrian University of Athens Semiconductor and Microsystems Laboratory Solid State Physics Section Department of Solid State Physics Semiconducting materials Materials *   Semi-insulating and high resistivity III-V bulk and epitaxial compound semiconductors *   Low resistivity III-V bulk and epitaxial compound semiconductors *   Silicon On Insulator (SOI) films *   Thin film polycrystalline Si *   2-D electron gas heterostructure structures based on III- V and III-N and dilute nitride semiconductors *   1-D semiconductors such as [H₂CN(I)=NH₂]₃MI₅ etc *   QD layers based on dilute nitride semiconductors *   Silicon and SiGe alloys IR spectroscopy Transport parameters The transport properties in semiconducting materials is assessed by employing the van der Pauw method to measure the: *   conductivity of bulk material and thin films *   Hall coefficient *   magnetoresistance *   illumination parallel to magnetic field for photoconductivity and photo-Hall coefficient and the same and different geometries for: *   illumination normal to magnetic field for magnetophotoele-ctric effect. The expermental setup consists of: *   Magnet with field intensity up to 1Tesla *   Closed cycle He APD-Cryogenics cryostat with temperature controller that allows sample assessment in the temprature range of 15K to 330K *   Keithley switch matrix (5x4) that allows the assessment of samples with resistance up to 10¹² Ohm *   Keithely  236 SMU for current sourcing and differential voltage measurement in van der Pauw geometry *   Vacuum system to ensure accurate tempera-ture control and electrical measurements at low and high temperatures *   Oriel monocromator with 12.5 cm focal length with a set of gratings, band pass filters and photodetectors to accurately cover the range from 190 nm to 3500 nm. *   All measurements are computer controlled with Labview software. Semiconducting Materials Semiconductor Devices MEMS Nanocomposites Department of Solid State Physics, Faculty of Physics, University of Athens University of Athens, School of Science, Faculty of Physics, Department of Solid State Physics, Contact, Maps Penepistimiopolis Zografos, Athens 15784 | Phone: +30 210 7276-722 | Fax: +30 210 7276-711 Reliability     Materials and     Transport parameters     Point defects     Dielectric films   van der Pauw geometry  Esperimental setup for assessment of transport parameters in semiconductors    “2^N-shot”   and   “directional”               crystallization Polycrysytalline Si formed by excimer-laser annealing crystalli- zation of amorphous silicon, using the sequential lateral solidification (SLS) technique